href="#ulink_b3de78af-86e2-50fe-8f06-73cebcb2effc">6.5 Examples of VCSEL‐ and EEL‐Based LiDARs
6.6 Automotive Communication: IVE (Infotainment) and C‐V2X
6.7 Market Summary
References
18 7 Illumination, Night Vision, and Industrial Heating 7.1 Introduction 7.2 Optical Properties of Illumination Sources 7.3 Commercial Examples of VCSEL Illuminators 7.4 VCSEL‐Based Industrial Heating 7.5 Summary
19 8 Single‐Mode VCSELs for Sensing Applications 8.1 Introduction 8.2 Single‐Mode VCSELs 8.3 Single‐Mode VCSEL Application Examples 8.4 Summary References
20 9 Single‐Mode VCSELs for Communications Applications 9.1 Introduction 9.2 LW‐VCSEL Design and Manufacturing 9.3 Quantum Communications 9.4 Summary References
21 10 Future Prospects 10.1 VCSEL Industry 10.2 Datacom VCSELs 10.3 VCSEL Arrays for 3D Sensing (Short Distance) 10.4 VCSEL Arrays for 3D Sensing and Imaging (Long Distance) 10.5 kW‐Level VCSEL Arrays for Industrial and Night Vision 10.6 Single‐Mode VCSELs for Communication and Sensing 10.7 Quantum Technologies 10.8 Neuromorphic/Neurophotonic Technologies 10.9 Biomedical/Bio‐Photonic Applications 10.10 New Directions of VCSEL Technologies (as of March 2021) 10.11 Concluding Remarks References
22 Appendix A: VCSELs Design Engineering A.1 Background References
23 Appendix B: Epitaxial Growth Engineering B.1 Technologies and Materials for VCSELs B.2 Epitaxial Growth B.3 Reactor Readiness and Calibrations B.4 Post‐Growth Characterizations and Acceptance B.5 Epitaxial Growth on Large‐Sized Wafers References Bibliography
24 Appendix C: Wafer Process Engineering C.1 Background of Wafer Processing C.2 Wafer Processing Methods: DOE and Lot C.3 Wafer Probe Measurements References Bibliography
25 Appendix D: Wafer Level Testing D.1 Introduction D.2 Post‐Epitaxial Characterization D.3 Wafer Fabrication Data D.4 Wafer Level Performance Test D.5 Package Level Validation D.6 Summary References
26 Appendix E: Reliability and Product Qualification E.1 Introduction E.2 Reliability Model Development E.3 Failure Modes in VCSELs E.4 Array Reliability and Sparing E.5 Considerations for High‐Power 2D VCSEL Arrays E.6 Qualification Standards E.7 Ongoing Quality Verification E.8 Summary References
