surface area [m
2/g], determined by the same calculation model applied to experimental gas adsorption data
|
AR
|
anti-reflective
|
|
ArS
|
sintering under 1 atm. of argon
|
|
AS
|
sintering under 1 atm. of air
|
|
a-SiO2 (or other
|
amorphous silica
|
|
chemical compound)
|
|
|
Vol%, atm.% or mol %
|
volume, atomic or molar percentage
|
|
wt.%
|
weight percentage
|
|
B
|
magnetic induction (or magnetic flux density) [T (=104 G (the gauss (G) is used in (cgs system)))]
|
|
BD
|
bulk density (g/cm3 or % of TD)
|
|
BD
f
|
fired state density
|
|
BD
g
|
green-body density
|
|
BET
|
Brunauer–Emmett–Teller
|
|
c
|
cubic lattice
|
|
CAD
|
computer-assisted design
|
|
CAM
|
computer-assisted machining
|
|
CCT
|
correlated color temperature
|
|
CF
|
crystal field
|
|
CFT
|
crystal field theory (used for electronic spectra interpretation)
|
|
CIE
|
commission int. de l`èclairage
|
|
CRI
|
color rendition index
|
|
CVD
|
chemical vapor deposition
|
|
CW
|
continuous wave laser
|
|
D
0
|
ionic diffusion coefficient at standard temperature [cm2 or m2/s]
|
|
D
50
|
median particles size in a distribution
|
|
D
BET
|
equivalent particle diameter [nm] as calculated by BET method
|
|
DTA
|
derivatographic thermal analysis
|
|
E
|
Young modulus [GPa]
|
|
EDS (EDX)
|
energy dispersive X-ray spectroscopy (for elemental chemical analysis)
|
|
EFG
|
edge defined film fed growth (technique for crystals growth)
|
|
EMPA
|
electron microscope probe elemental analysis
|
|
EMR
|
electromagnetic radiation
|
|
EO
|
electro-optic
|
|
EPR
|
electron paramagnetic resonance
|
|
ESR
|
electron spin resonance
|
|
FEA
|
finite element analysis
|
|
FIR
|
far infrared subdomain (15–1000 μm)
|
|
FOG (or FOX)
|
fluoro-oxide glass
|
|
GB
|
grain boundaries
|
|
GS
|
grain size
|
|
GSM
|
maximal GS
|
|
GSm
|
minimal GS
|
|
H
|
magnetic field strength [A/m; Oe (in cgs system)]
|
|
h
|
Planck's constant
|
|
HAADF
|
high angle annular dark field imaging
|
|
HIP
|
hot isostatic pressing
|
|
HK
|
hardness measured with the Knoop indenter
|
|
HP
|
hot pressing
|
|
HR-SEM
|
high resolution SEM
|
|
HR-TEM
|
high resolution TEM
|
|
HV
|
hardness measured with the Vickers indenter
|
|
IR
|
infrared domain of the spectrum
|
|
k or kB
|
Boltzmann's constant
|
|
k
|
wave vector (magnitude is the wave number)
|
|
K
Ic
|
[MPa m0.5]
|
|
LCD
|
liquid crystal display
|
|
LED
|
light-emitting diode
|
|
LF
|
ligand field
|
|
LFT
|
crystal field theory improved by consideration of covalency
|
|
m
|
monoclinic
|
|
M
b
|
grain-boundaries migration rate in pore-free matrix
|
|
MIR
|
middle domain of IR (2.5–15 μm)
|
|
MW
|
microwaves (EMR of wavelength 1 mm to ∼3 dm)
|
|
N
C
|
critical coordination number, in particles, of pores
|
|
NIR
|
near infrared subdomain of the IR (0.75–2.5 μm)
|
|
NUV
|
near ultraviolet subdomain (300–380 nm)
|
|
OLED
|
organic light emitting diode
|
|
op
|
open porosity (%)
|
|
OPA
|
|
surface area [m2/g], determined by the same calculation model applied to experimental gas adsorption data
