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Handbook of Microwave Component Measurements
With Advanced VNA Techniques
Second Edition
Joel P. Dunsmore
PhD., Sebastopol, CA, USA
This edition first published 2020
© 2020 John Wiley & Sons Ltd
Edition History
John Wiley and Sons (1e, 2012)
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Library of Congress Cataloging‐in‐Publication Data
Names: Dunsmore, Joel P., author.
Title: Handbook of microwave component measurements : with advanced VNA techniques / Joel P. Dunsmore.
Description: Second edition. | Hoboken, NJ : John Wiley & Sons, Inc.,
[2020] | Includes bibliographical references and index.
Identifiers: LCCN 2020003649 (print) | LCCN 2020003650 (ebook) | ISBN
9781119477136 (hardback) | ISBN 9781119477112 (adobe pdf) | ISBN 9781119477129 (epub)
Subjects: LCSH: Microwave devices–Testing.
Classification: LCC TK7876 .D84 2020 (print) | LCC TK7876 (ebook) | DDC 621.381/330287–dc23
LC record available at https://lccn.loc.gov/2020003649
LC ebook record available at https://lccn.loc.gov/2020003650
Cover design: Wiley
Cover image: Created by Joel Dunsmore, © Tuomas Lehtinen/Getty Images
To my dear wife Dana
Foreword to the Second Edition
Our world today is perpetually changing due to advancements in technology. As we begin the new decade, we are on the verge of large‐scale 5G deployments that will enable richer services across more devices while driving higher performance across the entire network, from the device to the edge to the core. Automotive capabilities are continuing the march toward progressively higher levels of autonomy. The number of connected devices being deployed in our homes, businesses, and cities, including devices we carry or wear, is growing exponentially. These are just a few of the changes that technology is enabling, and they will lead to further changes and innovations. The pace of change and the associated level of technological complexity are only accelerating. As has long been true with technology innovation, practical advancements in technology are possible only with corresponding advancements in measurement. Measurement helps confirm the creation of a new technology in the first place and later helps in applying and disseminating the technology with the required levels of performance, quality, and cost.
The measurement challenges with today's new technologies increasingly require total solutions. Traditional hardware measurement instruments are no longer enough. Of course, state‐of‐the‐art hardware is still required, but significant software capabilities that build on the core capabilities of the hardware are equally vital. Complex calibrations, advanced measurement algorithms, and sophisticated data analysis and visualization allow the raw measurement data to be turned into useful information that yields actionable insights. This is especially the case with microwave measurements, including measurements of microwave components based on vector network analyzer solutions.
It's also the case that no one measurement solution fits all. Different form factors are preferred for different use cases. Benchtop instruments
