Accelerated Life Testing of One-shot Devices. Narayanaswamy Balakrishnan

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Accelerated Life Testing of One-shot Devices - Narayanaswamy Balakrishnan

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      Table of Contents

      1  Cover

      2  Title Page

      3  Copyright

      4  Dedication

      5  Preface

      6  About the Companion Website

      7  Chapter 1: One‐Shot Device Testing Data 1.1 Brief Overview 1.2 One‐Shot Devices 1.3 Accelerated Life‐Tests 1.4 Examples in Reliability and Survival Studies 1.5 Recent Developments in One‐Shot Device Testing Analysis

      8  Chapter 2: Likelihood Inference 2.1 Brief Overview 2.2 Under CSALTs and Different Lifetime Distributions 2.3 EM‐Algorithm 2.4 Interval Estimation 2.5 Simulation Studies 2.6 Case Studies with R Codes

      9  Chapter 3: Bayesian Inference 3.1 Brief Overview 3.2 Bayesian Framework 3.3 Choice of Priors 3.4 Simulation Studies 3.5 Case Study with R Codes

      10  Chapter 4: Model Mis‐Specification Analysis and Model Selection 4.1 Brief Overview 4.2 Model Mis‐Specification Analysis 4.3 Model Selection 4.4 Simulation Studies 4.5 Case Study with R Codes

      11  Chapter 5: Robust Inference 5.1 Brief Overview 5.2 Weighted Minimum Density Power Divergence Estimators 5.3 Asymptotic Distributions 5.4 Robust Wald‐type Tests 5.5 Influence Function 5.6 Simulation Studies 5.7 Case Study with R Codes

      12  Chapter 6: Semi‐Parametric Models and Inference 6.1 Brief Overview 6.2 Proportional Hazards Models 6.3 Likelihood Inference 6.4 Test of Proportional Hazard Rates 6.5 Simulation Studies 6.6 Case Studies with R Codes

      13  Chapter 7: Optimal Design of Tests 7.1 Brief Overview 7.2 Optimal Design of CSALTs 7.3 Optimal Design with Budget Constraints 7.4 Case Studies with R Codes 7.5 Sensitivity of Optimal Designs

      14  Chapter 8: Design of Simple Step‐Stress Accelerated Life‐Tests 8.1 Brief Overview 8.2 One‐Shot Device Testing Data Under Simple SSALTs 8.3 Asymptotic Variance 8.4 Optimal Design of Simple SSALT 8.5 Case Studies with R Codes

      15  Chapter 9: Competing‐Risks Models 9.1 Brief Overview 9.2 One‐Shot Device Testing Data with Competing Risks 9.3 Likelihood Estimation for Exponential Distribution 9.4 Likelihood Estimation for Weibull Distribution 9.5 Bayesian Estimation 9.6 Simulation Studies 9.7 Case Study with R Codes

      16  Chapter 10: One‐Shot Devices with Dependent Components 10.1 Brief Overview 10.2 Test Data with Dependent Components 10.3 Copula Models 10.4

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