|
PW
|
Pulsed Wave
|
|
PZT
|
Piezoelectric
|
|
R&D
|
Research and development
|
|
RAMP
|
Rational Approximation of Material Properties
|
|
RDM
|
Relative Density Mapping
|
|
REP
|
Rotating Electrode Process
|
|
RF
|
Radio Frequency
|
|
RGB
|
Red‐Green‐Blue
|
|
RLS
|
Recursive Least Square
|
|
RMSE
|
Root Mean Square Error
|
|
RNN
|
Recurrent Neural Networks
|
|
ROS
|
Reactive Oxygen Species
|
|
RTE
|
Radiation Transfer Equation
|
|
SAW
|
Surface Acoustic Wave
|
|
SD
|
Signal Dynamics
|
|
SDAS
|
Secondary Dendritic Arm Spacing
|
|
SE
|
Secondary Electrons
|
|
SIMP
|
Solid Isotropic Material with Penalization
|
|
SINH
|
Sine Hyperbolic Function
|
|
SL
|
Sheet Lamination
|
|
SLD
|
Super‐Luminescent Diode
|
|
SLD‐OCT
|
Super‐Luminescent Diode—Optical Coherence Tomography
|
|
SLM
|
Selective Laser Melting
|
|
SLP
|
Sequential Linear Programming
|
|
SLR
|
Single‐Lens Reflex
|
|
SLS
|
Selective Laser Sintering
|
|
SN
|
Small Negative
|
|
SOM
|
Self‐Organizing Map
|
|
SP
|
Small Positive
|
|
SQP
|
Sequential Quadratic Programming
|
|
SRAS
|
Spatially Resolved Acoustic Spectroscopy
|
|
STF
|
Short‐Term Fluctuations
|
|
STL
|
Standard Tessellation Language or StereoLithography
|
|
STP
|
Standard for the Product Data
|
|
ST‐PCA
|
Spatially Weighted Principal Component Analysis
|
|
SVD
|
Singular Value Decomposition
|
|
SVM
|
Support Vector Machine
|
|
TCP
|
Topological Close‐Packed
|
|
TEM
|
Transverse Electromagnetic Modes
|
|
TGM
|
Temperature Gradient Mechanism
|
|
Ti
|
Titanium
|
|
TiC
|
Titanium Carbide
|
|
Ti‐HA
|
Titanium‐Hydroxyapatite
|
|
TMCs
|
Titanium‐Matrix Composites
|
|
TN
|
True Negative
|
|
TP
|
True Positive
|
|
TPMS
|
Triply Periodic Minimal Surface
|
|
TRL
|
Technology Readiness Level
|
|
TTT
|
Transformation Time Temperature
|
|
VC
|
Vanadium Carbides
|
|
VED
|
Volumetric Energy Density
|
|
VoF
|
Volume‐of‐Fluid
|
|
VTM
|
