captured into the local memory in the digital IF for a finite period of time. The entire ADC data stream is available for any further processing that might be beyond the algorithms available in the FPGA. Some modern VNAs have memory depths up to 4 Gb allowing deep memory captures. This mode of operation, while not typical, is useful for capturing anomalous effects such as transient or pulsed responses, as well as more complicated functions such as de‐modulation of IF signals.
2.2.7 Multiport VNAs
For a class of RF and microwave devices, the normal port count of two to four ports is not sufficient, and multiport measurements are required. There are two distinct classes of multiport test requirements that generate the need for two distinct RF architectures to support the measurements. In the past, RF switching test sets provide the basis for these multiport extensions, but recently true‐multiport VNAs have been introduced.
The first class of devices requires multiple sets of 2‐, 3‐, and 4‐port measurements. As such, the native mode measurements of the VNA are sufficient, and all that is required is RF switching to route the VNA ports to the various port pairs of the DUT. One example of such a DUT is a satellite multichannel‐diplexer (or multiplexer), which filters and separates signals from a common antenna path to each of several output channels, as shown in Figure 2.24. This unit has waveguide filters and interconnections to provide for the lowest possible loss.
Figure 2.24 A satellite multiplexer with many outputs.
Source: Courtesy ComDev Ltd., with permission.
This device requires two‐port measurements for each path from the common port so a 2‐port VNA with one common port and one switch port can make all the required measurements. These are sometimes known as switching test sets or simple switch trees.
The second class of devices requires a measurement from each port to every other port, and in general the response of any path depends upon the loading or match applied to every other port. A “Butler matrix” is a kind of signal dividing network used in phased‐array radar systems, which has this attribute. An eight‐port Butler has four inputs and four outputs, and the proper description is an 8 × 8 S‐parameter matrix. To measure such a device, a switch matrix must be able to allow measuring every path of the device. Informally, these types of switch matrixes are called full cross‐bar switches, which implies that from the two ports of the VNA, any path of the DUT can be measured.
There is a further requirement on the Butler matrix; a full N‐by‐N port calibration measurement must be able to be performed to correct for the imperfect match of at each port. This requires not only a full cross‐bar matrix but one that supports N‐by‐N calibration as well. A third style of test set allows such N‐by‐N S‐parameters called an extension test set, which extends or adds to the number of test ports from a VNA, but these have largely been replaced with true‐multiport VNAs.
More recently, several vendors have developed high‐port‐count VNAs with up to 24 internal ports (R&S ZNBT) or configurable module multiport VNAs (Keysight M9875), in which PXI‐based VNA modules can be flexibly configured to large numbers of ports (more than 66 ports).
The various forms of multiport configurations are described next.
2.2.7.1 Switching Test Sets
Switching test sets contain only RF switches formed in a matrix to provide the needed measurement paths. Figure 2.25 shows the block diagram of a simple switch tree test set. These test sets are typically constructed from either 1 × 2 RF switches or 1 × 4 to 1 × 6 RF switches. The 1 × 2 RF switches are sometimes used as some versions provide for an RF load on the unused ports. The 1 × 4 or 1 × 6 are typically mechanical switches and may not load the unused ports. If a multiport device has a path response between two ports that depends on the load match of a third port, the switch matrix must provide a load on the unused port. Larger switch configurations that have loads are often not available above 40 GHz, so 1 × 2 matrix arrays are used. Electronic 1 × 2 switches are available over a wide range of frequencies, but there are few electronic switches with higher port counts, so electronically switched test sets are typically configured from 1 × 2 RF switches.
Figure 2.25 Simple switch tree test set.
The simple switch matrixes of Figure 2.25 can be viewed as having a port 1 switch set and port 2 switch set, and any path from the port 1 side to the port 2 side can be measured, but no measurements are available between ports on the port 1 of the switch set, nor between ports on the port 2 side. While there are 24 ports available in the test set, only 12 paths can be measured from any one of the 12 input ports. Thus, this simple switch tree test set can support 144 paths, but a full 24 port device actually has 276 paths. There are 66 paths on the VNA port 1 side that cannot be measured, and there are 66 paths on the VNA port 2 side that cannot be measured. To obtain a full matrix of paths, a so‐called full cross‐bar switch matrix is required.
To accomplish full cross‐bar testing, the configuration of the test set shown in Figure 2.26 is used. In the general configuration, sets of 1 × n switch trees are cross connected to 1 × 2 switches at each port. This configuration provides for any path to be measured, but the unused ports are terminated back in the 1 × n switches, which are terminated internally in a load. If the 1 × N switches are not internally terminated (rather, they are left open), then the 1 × 2 switch must provide a termination for an unused port. Figure 2.26 shows a full cross‐bar switch constructed of a 1 × 2 port switch connecting to a pair of 1 × n switches. With this configuration, every port that is not connected to the VNA is terminated in a switch load. However, it is difficult to use this type of switch matrix to perform full N‐by‐N calibrations as the exact value of the load termination of any port changes depending upon the switch settings of other ports.
Figure 2.26 Full cross‐bar switching test set.
For example, if test set ports 1 and 6 are the active ports, ports 2–5 are terminated in the 1 × 6 switch on the left. If test set port 5 is made active, then port 6 may be terminated in the 1 × 6 switch on the right. The fact that the termination of the port depends on the path selected makes calibration beyond the two ports selected more difficult.
Custom switching test sets might have a reduced number of paths, forming a combination of full cross‐bar on some ports and simple switch trees on other ports. For high speed and reliability, solid‐state switching is preferred. Mechanical switches have almost no loss, but solid‐state switches can have considerable loss at microwave frequencies. This loss is after the directional‐coupler and dramatically degrades the RF performance of the system. On the other hand, mechanical switches can have slight changes in return loss for each switch cycle, also leading to instabilities.
