Spectroscopy for Materials Characterization. Группа авторов

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are arbitrarily scaled. Full lines plot the best fit curves of Eq. (2.78).

Si─O─)3Si─O.

E exc (eV) E em (eV) τ (μs) γ
2.07 1.92 35.2 ± 0.5 0.79 ± 0.02
1.99 29.9 ± 0.5 0.75 ± 0.02
4.77 1.92 44.3 ± 0.5 0.78 ± 0.02
1.99 41.2 ± 0.5 0.76 ± 0.02

      1

      The associated errors derive from the best‐fitting procedures.

      2.3.2 Zero‐Phonon Line Probed by Site‐Selective Luminescence

      The results reported in the previous section have evidenced that surface‐NBOHC (≡Si – O–)3Si – O is characterized by a small Stokes shift between its excitation and emission transitions peaked around 2 eV. This implies the possibility to detect, under site‐selective excitation, the ZPL and the vibrational structures with which the electronic transition is coupled. The main purposes of this study are: (i) the measure of the stretching frequency of the Si─O bond in the ground and in the excited electronic state; (ii) the measure of the phonon coupling parameters; (iii) the measure of the inhomogeneous distribution of the ZPL.

Image described by caption
Si─O─)3Si─O under pulsed laser excitation at E exc = 1.997 eV measured on decreasing temperature from 290K to 8 K. At lower temperature, the ZPL and the vibration 920 cm−1 apart from it are clearly visible.

Image described by caption
Si─O─)3Si─O under pulsed laser excitation at E exc = 1.997 eV measured at T = 8 K. The shaded area represents the total integrated intensity, I TOT, the shaded area in the inset corresponds to the integrated intensity of ZPL, I ZPL. Panel (b): Temperature dependence of the Debye–Waller factor; solid line is the best fit curve of Eq. (2.79).

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