Antenna-in-Package Technology and Applications. Duixian Liu

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      USA

       Manos M. Tentzeris

      The School of Electrical and Computer Engineering

      Georgia Institute of Technology

      Atlanta

      USA

       Duixian Liu

      Thomas. J. Watson Research Center, IBM

      New York

      USA

       Amin Enayati

      Emerson & Cuming Anechoic Chambers

      Antwerp Area

      Belgium

       Karin Mohammadpour‐Aghdam

      School of Electrical and Computer Engineering

      University of Tehran

      Iran

       Farbod Molaee‐Ghaleh

      School of Electrical and Computer Engineering

      University of Tehran

      Iran

      Rapid advances in semiconductor and packaging technologies have promoted the development of two system design concepts known as system on chip (SoC) and system‐in‐package (SiP). SoC integrates analog, digital, mixed‐signal, and radio frequency (RF) circuits on a chip by a semiconductor process, while SiP implements separately manufactured functional blocks in a package by a packaging process. SoC yields improved system reliability and functionality at a much lower system cost. However, it degrades system performance and increase system power consumption due to unavoidable compromises in every circuit type in order to use the same material and process. On the contrary, SiP enhances system performance and reduces system power consumption but results in lower system reliability and higher system cost because of functional blocks and the fabrication of the package with different materials and processes.

      Antennas are essential components for wireless systems. It is known that antennas are difficult to miniaturize, let alone integrate. Nevertheless, there have been attempts to integrate an antenna (or antennas) with other circuits in a die on a wafer using the back end of the line. An antenna realized in such a way is called an antenna on a chip (AoC) and is more suitable for terahertz applications for cost and performance reasons. In addition, there have been studies to integrate an antenna (or antennas) with a radio or radar die (or dies) into a standard surface‐mounted device using a packaging process, which has created a new trend in antenna and packaging termed antenna‐in‐package (AiP). AoC and AiP are obviously subsets of the above SoC and SiP concepts, so why do we specifically differentiate them from SoC and SiP? The reason is to highlight their unique property of radiation.

      The development of mmWave AiP technology is particularly challenging because of the associated complexity in design, fabrication, integration, and testing. This book aims to face these challenges through disseminating relevant knowledge, addressing practical engineering issues, meeting immediate demands for existing systems, and providing the antenna and packaging solutions for the latest and emerging applications.

      This book contains 11 chapters. The first five chapters lay some foundation and introduce fundamental knowledge. After the introductory chapter about how AiP technology has been developed as we know it today, several types of antennas are discussed in Chapter 2. An attempt is made to summarize the basic antennas and those antennas specifically developed for AiP technology. Emphasis is given to microstrip patch antennas and arrays, grid array antennas, Yagi–Uda antennas, and magneto‐electric dipole antennas because of their dominance in AiP technology. Performance improvement techniques of antennas for AiP technology are also described. Chapter 3 describes today's mainstream packaging solutions with either wire‐bond or flip‐chip interconnects, wafer‐level package, and fan‐out wafer‐level package. Chapter 4 focuses on the electrical, mechanical, and thermal co‐design for AiP modules. More importantly, the thermal management considerations for next‐generation heterogeneous integrated systems are reviewed in order to address the growing need for cooling the high‐power devices of future radio systems. Chapter 5 presents the design and optimization of an anechoic test facility for testing mmWave integrated antennas. This facility can be used for both probe‐based and connector‐based measurements.

      The last chapter turns to 3D AiP for power transfer, sensor nodes, and Internet

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